INTERCHANGE OF ENERGY BETWEEN AN ELECTRON BEAM AND AN OSCILLATING ELECTRIC FIELD

被引:15
|
作者
MARCUM, J
机构
关键词
D O I
10.1063/1.1707635
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:4 / 11
页数:8
相关论文
共 50 条
  • [1] ELECTRON STREAMS IN AN OSCILLATING ELECTRIC FIELD
    SACKINGER, W
    [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (05) : 1784 - &
  • [2] Study on Electron Beam Bunching in a Gigahertz Oscillating Electric-Field Direct-Driven Cold-Cathode Electron Gun
    Xing, Yang
    Zhang, Yu
    Xu, Ningsheng
    Ke, Yanlin
    Li, Baohong
    Deng, Shaozhi
    [J]. 2019 INTERNATIONAL VACUUM ELECTRONICS CONFERENCE (IVEC), 2019,
  • [3] INTERCHANGE STABILIZATION BY ELECTRON BEAM FEEDBACK
    PRATER, R
    [J]. BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1971, 16 (11): : 1298 - &
  • [4] Electron-positron pair production in a bifrequent oscillating electric field
    Akal, Ibrahim
    Villalba-Chavez, Selym
    Mueller, Carsten
    [J]. PHYSICAL REVIEW D, 2014, 90 (11):
  • [5] ELECTRON BEAM DEMODULATION IN O-TYPE DEVICES WITH ENERGY EXCHANGE BETWEEN BEAM AND FIELD
    BELYAVSK.YD
    [J]. RADIO ENGINEERING AND ELECTRONIC PHYSICS-USSR, 1969, 14 (07): : 1167 - &
  • [6] ELECTRIC FIELD IN AN OSCILLATING DISCHARGE
    WARNER, RE
    OWEN, GE
    STEWART, AB
    [J]. PHYSICAL REVIEW, 1954, 96 (03): : 816 - 816
  • [7] EFFECT OF THE OSCILLATING ELECTRIC FIELD DUE TO THE OSCILLATING ELECTRIC DIPOLE ON RAMAN LINES
    Kapil, Khanna M.
    Gilbert, Murei K.
    [J]. EAST EUROPEAN JOURNAL OF PHYSICS, 2019, (04): : 47 - 57
  • [8] Beam damage by the induced electric field in transmission electron microscopy
    Jiang, Nan
    [J]. MICRON, 2016, 83 : 79 - 92
  • [9] Dipole rectification in an oscillating electric field
    Pototsky, A.
    Janson, N. B.
    Marchesoni, F.
    Savel'ev, S.
    [J]. EPL, 2009, 88 (03)
  • [10] Numerical investigation of space charge electric field for a sheet electron beam between two conducting planes
    Gokhale, A
    Vyas, P
    Panikar, J
    Choyal, Y
    Maheshwari, KP
    [J]. PRAMANA-JOURNAL OF PHYSICS, 2002, 58 (01): : 67 - 77