SPHERICAL-ABERRATION CORRECTION OF AN ELECTRON LENS BY MEANS OF ELECTRON HOLOGRAPHY

被引：0

作者：

MATSUDA, T ^{[1
]}

TONOMURA, A ^{[1
]}

ENDO, J ^{[1
]}

机构：

[1] HITACHI LTD,CENT RES LAB,KOKUBUNJI,TOKYO 185,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1979年 / 28卷 / 03期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：246 / 246

页数：1

共 50 条

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