A HIGH-INTENSITY MULTI-PURPOSE PIEZOELECTRIC PULSED MOLECULAR-BEAM SOURCE

被引：339
|
作者：
PROCH, D
TRICKL, T
机构：
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1989年 / 60卷 / 04期
关键词：
D O I：
10.1063/1.1141006
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：713 / 716
页数：4
相关论文
共 50 条
  • [1] A HIGH-INTENSITY PULSED ELECTRON-BEAM SOURCE
    ROHATGI, VK
    IYYENGAR, SK
    RON, PH
    MITTAL, KC
    PAITHANKAR, AS
    RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1982, 63 (1-4): : 191 - 195
  • [2] A HIGH-INTENSITY MOLECULAR-BEAM OF VINYL AND ETHYNYL RADICALS
    BLUSH, JA
    PARK, J
    CHEN, P
    JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1989, 111 (24) : 8951 - 8953
  • [3] A PULSED MOLECULAR-BEAM SOURCE
    ADRIAENS, MR
    ALLISON, W
    FEUERBACHER, B
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1981, 14 (12): : 1375 - 1377
  • [4] PULSED MOLECULAR-BEAM SOURCE
    BASSI, D
    IANNOTTA, S
    NICCOLINI, S
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (01): : 8 - 11
  • [5] A source for a high-intensity pulsed beam of metastable helium atoms
    Halfmann, T
    Koensgen, J
    Bergmann, K
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2000, 11 (10) : 1510 - 1514
  • [6] BEAM CHARACTERIZATION AND MONITORING OF A HIGH-INTENSITY PULSED ELECTRON SOURCE
    LING, CC
    WEISS, H
    EPP, ER
    RADIATION RESEARCH, 1973, 55 (03) : 572 - 572
  • [7] BEAM CHARACTERIZATION AND MONITORING OF A HIGH-INTENSITY PULSED ELECTRON SOURCE
    LING, CC
    WEISS, H
    EPP, ER
    RADIATION RESEARCH, 1973, 56 (02) : 307 - 319
  • [8] High-intensity pulsed beam source with tunable operation mode
    Nashilevskiy, A. V.
    Kanaev, G. G.
    Ezhov, V. V.
    Shamanin, V. I.
    5TH INTERNATIONAL CONGRESS ON ENERGY FLUXES AND RADIATION EFFECTS 2016, 2017, 830
  • [9] A HIGH-INTENSITY PULSED ION SOURCE
    GOW, JD
    FOSTER, JS
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1953, 24 (08): : 606 - 610
  • [10] HIGH REPETITION RATE PULSED MOLECULAR-BEAM SOURCE FOR LASER SPECTROSCOPY
    CROSS, JB
    VALENTINI, JJ
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1981, 182 (AUG): : 178 - PHYS
12345