CONTINUOUSLY RECORDING REFRACTIVE-INDEX SPECTROGRAPH FOR TRANSPARENT AND OPAQUE INSULATORS AND SEMICONDUCTORS

被引：9

|

作者：

ENKE, K

TOLKSDORF, W

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1978年 / 49卷 / 12期

关键词：

D O I：

10.1063/1.1135359

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：1625 / 1628

页数：4

相关论文

共 50 条

[1] REFRACTIVE-INDEX BEHAVIOR OF TERNARY CHALCOPYRITE SEMICONDUCTORS
WEMPLE, SH
GABBE, JD
BOYD, GD
JOURNAL OF APPLIED PHYSICS, 1975, 46 (08) : 3597 - 3605
[2] REFRACTIVE-INDEX BEHAVIOR OF AMORPHOUS SEMICONDUCTORS AND GLASSES
WEMPLE, SH
PHYSICAL REVIEW B, 1973, 7 (08): : 3767 - 3777
[3] REFRACTIVE-INDEX AND BIREFRINGENCE OF SEMICONDUCTORS WITH THE WURTZITE STRUCTURE
PIKHTIN, AN
YASKOV, AD
SOVIET PHYSICS SEMICONDUCTORS-USSR, 1981, 15 (01): : 8 - 12
[4] TECHNIQUE FOR DETERMINING THE REFRACTIVE-INDEX OF SEMICONDUCTORS AND DIELECTRICS
KISELEVA, NK
KOLOMIETS, BT
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1981, 24 (01) : 263 - 266
[5] METHOD OF REFRACTIVE-INDEX MEASUREMENT FOR TRANSPARENT SUBSTANCES
ODARICH, VA
OPTIKA I SPEKTROSKOPIYA, 1974, 37 (04): : 761 - 764
[6] TEMPERATURE-DEPENDENCE OF THE REFRACTIVE-INDEX IN SEMICONDUCTORS
BERTOLOTTI, M
BOGDANOV, V
FERRARI, A
JASCOW, A
NAZOROVA, N
PIKHTIN, A
SCHIRONE, L
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1990, 7 (06) : 918 - 922
[7] DETERMINATION OF REFRACTIVE-INDEX AND THICKNESS OF A TRANSPARENT FILM
KHAWAJA, E
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1976, 9 (14) : 1939 - 1943
[8] METHOD FOR MEASURING THE REFRACTIVE-INDEX OF TRANSPARENT SOLIDS
BASS, JD
WEIDNER, DJ
REVIEW OF SCIENTIFIC INSTRUMENTS, 1984, 55 (10): : 1569 - 1573
[9] DETERMINATION OF REFRACTIVE INDEX OF TRANSPARENT FILMS OF OPAQUE SUBSTRATES
AYUPOV, BM
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR, 1970, (02): : 559 - &
[10] VARIATION OF REFRACTIVE-INDEX WITH ENERGY-GAP IN SEMICONDUCTORS
RAVINDRA, NM
SRIVASTAVA, VK
INFRARED PHYSICS, 1979, 19 (05): : 603 - 604

← 1 2 3 4 5 →