DIFFUSION OF TI IN ALPHA-ZR SINGLE-CRYSTALS

被引：17
|
作者：
HOOD, GM [1 ]
ZOU, H [1 ]
SCHULTZ, RJ [1 ]
BROMLEY, EH [1 ]
JACKMAN, JA [1 ]
机构：
[1] CANADA CTR MINERAL & ENERGY TECHNOL,MET TECHNOL LABS,OTTAWA,ON K1A 0G1,CANADA
来源：
JOURNAL OF NUCLEAR MATERIALS | 1994年 / 217卷 / 03期
关键词：
D O I：
10.1016/0022-3115(94)90371-9
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Ti diffusion coefficients (D) have been measured in nominally pure alpha-Zr single crystals (773-1124 K) in directions both parallel (D(pa)) and perpendicular (D(pe), few data) to the c-axis: tracer techniques and secondary ion mass spectrometry were used to determine the diffusion profiles. The results show a temperature dependence which may be interpreted in terms of two regions of diffusion behaviour. Above 1035 K, region I, diffusion conforms to the expectations of intrinsic behaviour with normal Arrhenius law constants: D(pa) = 1.7 X 10(-3) exp(-2.93 +/- 0.08 eV/kT) m2/s. Below 1035 K, region II, D's appear to be enhanced with respect to an extrapolation of region I behaviour.
引用
收藏
页码：229 / 232
页数：4
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