STATE ASSIGNMENT AND TESTABILITY OF PLA-BASED FINITE STATE MACHINES

被引：1
|
作者：
BUONANNO, G
SERRA, M
机构：
[1] POLITECN MILAN,DIPARTIMENTO ELETTRON,I-20133 MILAN,ITALY
[2] UNIV VICTORIA,DEPT COMP SCI,VICTORIA V8W 3P6,BC,CANADA
来源：
MICROPROCESSING AND MICROPROGRAMMING | 1992年 / 35卷 / 1-5期
关键词：
D O I：
10.1016/0165-6074(92)90344-7
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
The problem of optimal and testable state assignment in PLA-based FSM is discussed. Test sequences generated by a functional test pattern generation method have been used to study the implication of state assignment on the testability of the FSM. Simulation results show that a functional test, generated with no knowledge of the state assignment, allows to obtain almost always a full fault coverage.
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页码：391 / 398
页数：8
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