CU AG BIMETALLIC STRIP - DIFFUSION PROFILES USING AES AND EDX

被引：0
|
作者：
MOIR, PA
FITZGERALD, AG
机构：
来源：
INSTITUTE OF PHYSICS CONFERENCE SERIES | 1990年 / 98期
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D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Auger electron spectroscopy and energy-dispersive x-ray microanalysis have been used to characterise the degree of interdiffusion between the constituent elements in Cu/Ag bimetallic strip. A high resolution Auger microprobe was used to determine the surface composition of the two phases present in a region of Cu/Ag eutectic alloy. After ion bombardment a surface layer of uniform composition was found to be present.
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页码：315 / 318
页数：4
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