MEASUREMENT OF THE COMPLEX REFRACTIVE-INDEX AND COMPLEX DIELECTRIC PERMITTIVITY OF TPS SPACE-SHUTTLE TILE MATERIALS AT MILLIMETER WAVELENGTHS

被引:0
|
作者
AFSAR, MN
CHI, H
LI, XH
机构
[1] Department of Electrical Engineering, Tufts University, Medford, 02155, Massachusetts
关键词
D O I
10.1007/BF01010131
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Complex Refractive Index and Dielectric Permittivity studies of presently used space shuttle tile materials at millimeter wavelength region reveal these tiles to exhibit similar absorption characteristics as fused silica materials. This absorption is mainly related to the water content in the specimen. A strong bire-fringence is observed at least in one of these fibrous refractory composite materials. © 1990 Plenum Publishing Corporation.
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页码:777 / 783
页数:7
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