RECENT ADVANCES IN X-RAY PHOTOELECTRON MICROSCOPY

被引:8
|
作者
HOLLDACK, K [1 ]
GRUNZE, M [1 ]
机构
[1] UNIV HEIDELBERG,D-69120 HEIDELBERG,GERMANY
关键词
SURFACE TECHNIQUES; ELECTRON SPECTROSCOPY FOR CHEMICAL ANALYSIS; X-RAY PHOTOELECTRON MICROSCOPY;
D O I
10.1016/0003-2670(93)E0521-8
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
A short discussion is first presented of x-ray photoelectron microscopes operated with laboratory x-ray sources. With typical laboratory sources, the spectroscopic contrast in the images is based on differences in binding energy for the various chemical species, differential charging or photoelectron diffraction effects. Using synchrotron radiation, the initial and final states of the photoemission process can be defined and used to enhance chemical state information and contrast in laterally resolved images. Some recent examples from the authors group using synchrotron radiation in connection with a commercial x-ray photoelectron microscope (ESCASCOPE) to image lateral inhomogeneities in organic films and magnetic domains on magnetized substrates are discussed.
引用
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页码:125 / 138
页数:14
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