ACCURATE SPECTROPHOTOMETER FOR MEASURING TRANSMITTANCE OF SOLID AND LIQUID MATERIALS

被引:33
|
作者
MAVRODINEANU, R [1 ]
机构
[1] NBS, ANAL CHEM DIV, WASHINGTON, DC 20234 USA
关键词
D O I
10.6028/jres.076A.037
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
引用
收藏
页码:405 / 425
页数:21
相关论文
共 50 条
  • [1] SPECTROPHOTOMETER FOR MEASURING SPECTRAL REFLECTANCE AND TRANSMITTANCE
    WU, PY
    GU, PF
    TANG, JF
    [J]. APPLIED OPTICS, 1994, 33 (10): : 1975 - 1979
  • [2] Fast and accurate techniques for measuring the complex transmittance of liquid crystal light valves
    Bader, G
    Buerkle, R
    Lueder, E
    Fruehauf, N
    Zeile, C
    [J]. LIQUID CRYSTAL MATERIALS, DEVICES, AND APPLICATIONS V, 1997, 3015 : 93 - 104
  • [3] Spectrophotometer for measuring spectral transmittance and reflectance of large aperture optical element
    Liu, J
    Li, HF
    Liu, X
    Gu, PF
    [J]. OPTICAL DESIGN AND TESTING II, PTS 1 AND 2, 2005, 5638 : 229 - 236
  • [4] IMPROVED MERCURY PYCNOMETRY FOR MEASURING ACCURATE VOLUMES OF SOLID MATERIALS
    YAMAGISHI, S
    TAKAHASHI, Y
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 1992, 3 (03) : 270 - 274
  • [5] MULTIPLE-INTEGRATING SPHERE SPECTROPHOTOMETER FOR MEASURING ABSOLUTE SPECTRAL REFLECTANCE AND TRANSMITTANCE
    ZERLAUT, GA
    ANDERSON, TE
    [J]. APPLIED OPTICS, 1981, 20 (21): : 3797 - 3804
  • [6] EXPANSION OF THE TRANSMITTANCE SCALE OF A SPECTROPHOTOMETER
    BASTIAN, R
    WEBERLING, R
    PALILLA, F
    [J]. SPECTROCHIMICA ACTA, 1958, 12 (04): : 386 - 386
  • [7] PHOTOMETER FOR MEASURING THE DIFFUSE TRANSMITTANCE OF SCATTERING MATERIALS
    VOISHVILLO, NA
    KHAPUGINA, EI
    [J]. SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1984, 51 (06): : 336 - 338
  • [8] Lumen: A highly versatile spectrophotometer for measuring the transmittance throughout very long samples as well as microstructures
    Montecchi, M
    Baccaro, S
    Dafinei, I
    Diemoz, M
    Montereali, RM
    Somma, F
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2004, 75 (11): : 4636 - 4640
  • [9] APPARATUS FOR MEASURING ELECTRICAL CONDUCTIVITY OF SEMICONDUCTOR MATERIALS IN LIQUID AND SOLID STATES
    NIKITIN, EN
    ZAITSEV, VK
    [J]. INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR, 1965, (04): : 952 - &
  • [10] Dedicated spectrophotometer for localized transmittance and reflectance measurements
    Abel-Tiberini, L
    Lemarquis, F
    Lequime, M
    [J]. APPLIED OPTICS, 2006, 45 (07) : 1386 - 1391