ELECTRON SPECTROSCOPIC STUDIES OF ELECTRICALLY ACTIVE GRAIN-BOUNDARIES IN ZNO

被引：33
|
作者：
STUCKI, F
BRUESCH, P
GREUTER, F
机构：
来源：
SURFACE SCIENCE | 1987年 / 189卷
关键词：
D O I：
10.1016/S0039-6028(87)80445-4
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：294 / 299
页数：6
相关论文
共 50 条
  • [1] SELECTIVE OBSERVATION OF ELECTRICALLY ACTIVE GRAIN-BOUNDARIES IN SILICON
    REDFIELD, D
    APPLIED PHYSICS LETTERS, 1981, 38 (03) : 174 - 176
  • [2] TRANSIENT-RESPONSE OF ELECTRICALLY ACTIVE GRAIN-BOUNDARIES IN POLYCRYSTALLINE SEMICONDUCTORS
    TUA, PF
    ROSSINELLI, M
    GREUTER, F
    PHYSICA SCRIPTA, 1988, 38 (03): : 491 - 497
  • [3] COMPOSITIONAL MICROCHARACTERIZATION OF ELECTRICALLY ACTIVE AND CHEMICALLY PASSIVATED SILICON GRAIN-BOUNDARIES
    KAZMERSKI, LL
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (03): : 1287 - 1290
  • [4] TRANSMISSION ELECTRON-MICROSCOPY STUDIES OF GRAIN-BOUNDARIES IN CERAMICS
    RUHLE, M
    JOURNAL DE PHYSIQUE, 1982, 43 (NC-6): : 115 - 133
  • [5] IMPEDANCE SPECTROSCOPY OF GRAIN-BOUNDARIES IN NANOPHASE ZNO
    LEE, J
    HWANG, JH
    MASHEK, JJ
    MASON, TO
    MILLER, AE
    SIEGEL, RW
    JOURNAL OF MATERIALS RESEARCH, 1995, 10 (09) : 2295 - 2300
  • [6] AEM OBSERVATION OF GRAIN-BOUNDARIES IN ZNO VARISTORS
    TOMOKIYO, Y
    TERASAKA, K
    SUYAMA, Y
    JOURNAL OF ELECTRON MICROSCOPY, 1989, 38 (04): : 262 - 262
  • [7] ELECTRICAL CHARACTERISTICS OF SINGLE ZNO GRAIN-BOUNDARIES
    SUKKAR, MH
    TULLER, HL
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1987, 134 (8B) : C473 - C473
  • [8] Electrically active grain boundaries in GaP
    Holt, DB
    Napchan, E
    MICROSCOPY OF SEMICONDUCTING MATERIALS 1999, PROCEEDINGS, 1999, (164): : 89 - 92
  • [9] Electrically active grain boundaries in ZnO varistors by liquid-infiltration method
    Chun, SY
    Shinozaki, K
    Mizutani, N
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2000, 11 (01) : 73 - 80
  • [10] Electrically active grain boundaries in ZnO varistors by liquid-infiltration method
    Sung-Yong Chun
    Kazuo Shinozaki
    Nobuyasu Mizutani
    Journal of Materials Science: Materials in Electronics, 2000, 11 : 73 - 80
12345