MEASUREMENT OF MICROWAVE CONDUCTIVITY OF SEMICONDUCTORS BY EDDY-CURRENT LOSS METHOD

被引：8

作者：

WATANABE, Y ^{[1
]}

MAEDA, K ^{[1
]}

SAITO, S ^{[1
]}

UDA, K ^{[1
]}

机构：

[1] UNIV OSAKA PREFECTURE,COLL ENGN,DEPT ELECTR,SAKAI,OSAKA 591,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1977年 / 16卷 / 11期

关键词：

D O I：

10.1143/JJAP.16.2007

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2007 / 2010

页数：4

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