共 50 条
- [1] Effects of fluorine contamination on spin-on dielectric thickness in semiconductor manufacturing [J]. ADVANCES IN PATTERNING MATERIALS AND PROCESSES XXXV, 2018, 10586
- [2] Microeconomics of yield learning in semiconductor manufacturing [J]. COST AND PERFORMANCE IN INTEGRATED CIRCUIT CREATION, 2003, 5043 : 41 - 56
- [3] Characterization of Organic Contamination in Semiconductor Manufacturing Processes [J]. FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009, 2009, 1173 : 23 - +
- [5] IMPACT OF VACUUM EQUIPMENT CONTAMINATION ON SEMICONDUCTOR YIELD [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1992, 10 (04): : 1863 - 1868