MEASUREMENTS OF THE DIELECTRIC-CONSTANT OF LOSSY CERAMICS

被引：7
|
作者：
MAIN, W
TANTAWI, S
HAMILTON, J
机构：
[1] Laboratory for Plasma Research, University of Maryland, College Park, MD
来源：
INTERNATIONAL JOURNAL OF ELECTRONICS | 1992年 / 72卷 / 03期
关键词：
Dielectric constant - Lossy ceramics - Shorted waveguides;
D O I：
10.1080/00207219208925592
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The complex dielectric constant epsilon = epsilon(r)-j-epsilon(i) of lossy ceramics is determined by measuring the complex reflection coefficient (rho) of a rectangular sample placed at the end of a shorted waveguide. These measurements are verified by comparing the measured transmission and reflection through the same samples with the transmission and reflection calculated from the measured-epsilon. This technique, which requires only a scalar detector, a source and a frequency counter, is automated using a GPIB interface to a PC.
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页码：499 / 512
页数：14
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