ON THE INVESTIGATION OF SPECIMEN CONTAMINATION IN THE ELECTRON MICROSCOPE

被引：56

|

作者：

HILLIER, J

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1948年 / 19卷 / 03期

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D O I：

10.1063/1.1715049

中图分类号：

O59 [应用物理学];

学科分类号：

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页码：226 / 230

页数：5

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