DETERMINATION OF SUPERLATTICE STRUCTURAL PARAMETERS BY MEANS OF FAR-INFRARED AND MIDINFRARED REFLECTIVITY

被引：3

作者：

SCAMARCIO, G ^{[1
]}

GADALETA, CK ^{[1
]}

SIBILANO, M ^{[1
]}

PLOOG, K ^{[1
]}

机构：

[1] MAX PLANCK INST FESTKORPERFORSCH,W-7000 STUTTGART,GERMANY

来源：

SOLID STATE COMMUNICATIONS | 1992年 / 84卷 / 07期

关键词：

D O I：

10.1016/0038-1098(92)90474-N

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

We investigate infrared reflectivity of GaAs/AlAs multiple heterostructures not only in the far- but also in the mid-ir range up to 4000 cm- 1. In the transparency region above the "Reststrahlen" bands interference fringes are observed which originate from multiple reflections of radiation inside the SL slab as a whole. A simple analysis of experimental data in the extended ir range, performed in the effective medium approximation, allows a very accurate determination not only of the total SL thickness but also of the individual layer thicknesses.

引用

页码：757 / 760

页数：4

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