ROLE OF GRAIN-BOUNDARIES IN RUPTURE OF THIN GOLD FILMS BY ELECTROMIGRATION

被引：0
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作者：
ROUAIS, JC
CHEVRETON, M
LORMAND, G
EYRAUD, C
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来源：
COMPTES RENDUS HEBDOMADAIRES DES SEANCES DE L ACADEMIE DES SCIENCES SERIE B | 1972年 / 274卷 / 12期
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O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号：
07 ; 0710 ; 09 ;
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页码：827 / +
页数：1
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