DETERMINATION OF LAMELLAE IN SEGMENTED POLYURETHANES BY ELECTRON-MICROSCOPY

被引：18

作者：

FOKS, J ^{[1
]}

MICHLER, G ^{[1
]}

NAUMAN, I ^{[1
]}

机构：

[1] KOMBINAT VEB CHEM WERKE BUNA,WISSENSCHAFTLICHES FORSCH & KOORDINIERUNGSZENTRUM,DDR-4212 SCHKOPAU,GER DEM REP

来源：

POLYMER | 1987年 / 28卷 / 13期

关键词：

D O I：

10.1016/0032-3861(87)90375-2

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

引用

页码：2195 / 2199

页数：5

共 50 条

[1] SCANNING AND TRANSMISSION ELECTRON-MICROSCOPY STUDIES ON A MODEL SERIES OF SPHERULITIC SEGMENTED POLYURETHANES
WILKES, GL
SAMUELS, SL
CRYSTAL, R
JOURNAL OF MACROMOLECULAR SCIENCE-PHYSICS, 1974, B 10 (02): : 203 - 229
[2] Electron microscopy in crosslinking degree inspection of segmented polyurethanes
Janik, H
PROCEEDINGS OF THE 5TH MULTINATIONAL CONGRESS ON ELECTRON MICROSCOPY, 2001, : 481 - 482
[3] STRUCTURE AND MORPHOLOGY OF SEGMENTED POLYURETHANES .3. ELECTRON-MICROSCOPY AND SMALL-ANGLE X-RAY-SCATTERING STUDIES OF AMORPHOUS RANDOM SEGMENTED POLYURETHANES
CHENTSAI, CHY
THOMAS, EL
MACKNIGHT, WJ
SCHNEIDER, NS
POLYMER, 1986, 27 (05) : 659 - 666
[4] SCANNING ELECTRON-MICROSCOPY OF CHANNEL CATFISH OLFACTORY LAMELLAE
CAPRIO, J
RADERMANLITTLE, R
TISSUE & CELL, 1978, 10 (01): : 1 - 9
[5] ELECTRON-MICROSCOPY STUDY OF AUGITE EXSOLUTION LAMELLAE IN ENSTATITE
KOHLSTED.DL
VANDERSA.JB
AMERICAN MINERALOGIST, 1974, 59 (9-10) : 1132 - 1132
[6] DETERMINATION OF ASBESTOS BY ELECTRON-MICROSCOPY
STEWART, I
MICROSCOPE, 1972, 20 (03): : 287 - &
[7] TRANSMISSION ELECTRON MICROSCOPY OF SEGMENTED POLYURETHANES WITH RUTHENIUM TETROXIDE AS A STAINING AGENT
肖凤飞
陈寿羲
金永泽
施良和
徐懋
Chinese Journal of Polymer Science, 1991, (03) : 246 - 250
[8] ELECTRON-MICROSCOPY OF WIDTH GROWTH OF LAMELLAE IN PARTIALLY CRYSTALLINE POLYMERS (1)
PETERMANN, J
GLEITER, H
COLLOID AND POLYMER SCIENCE, 1976, 254 (03) : 247 - 248
[9] HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY OF EXSOLUTION LAMELLAE IN ENSTATITE
VANDERSANDE, JB
KOHLSTEDT, DL
PHILOSOPHICAL MAGAZINE, 1974, 29 (05) : 1041 - 1049
[10] REMARK ON PHASE DETERMINATION IN ELECTRON-MICROSCOPY
FRANK, J
OPTIK, 1973, 38 (05): : 582 - 584

← 1 2 3 4 5 →