TEMPERATURE AND MODE DEPENDENCE OF FERROMAGNETIC THIN FILM RESONANCE LINEWIDTHS IN RANGE 4 DEGREES -300 DEGREES K

被引：1

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作者：

SHIRKEY, CT

WIGEN, PE

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来源：

JOURNAL OF APPLIED PHYSICS | 1970年 / 41卷 / 03期

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D O I：

10.1063/1.1658795

中图分类号：

O59 [应用物理学];

学科分类号：

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页码：1019 / &

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