SUPERMODULUS EFFECT IN CU/MN MULTILAYER FILMS

被引：1
|
作者：
NALLAMSHETTY, K
ANGADI, MA
WHITING, R
机构：
[1] Thin Film Laboratory, Department of Physics, The University of the West Indies, St. Augustine, Trinidad and Tobago
来源：
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1993年 / 20卷 / 03期
关键词：
D O I：
10.1016/0921-5107(93)90252-I
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The Young modulus of Cu/Mn metallic multilayer films has been investigated for bilayer wavelengths in the range 4-18 nm. The multilayer films, deposited by electron beam evaporation, exhibit an appreciable increase in Young modulus (supermodulus effect). The bilayer wavelength dependence of the Young modulus shows an oscillatory behaviour.
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页码：L5 / L7
页数：3
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