共 50 条
- [1] ELECTRON SEMICONDUCTOR DETECTOR FOR THE SCANNING ELECTRON-MICROSCOPE IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1983, 47 (06): : 1070 - 1072
- [2] ELECTRON-MICROSCOPE TRANSMISSION ELECTRON-MICROSCOPE AND SCANNING ELECTRON-MICROSCOPE DENKI KAGAKU, 1986, 54 (08): : 667 - 670
- [3] SECONDARY-ELECTRON DETECTOR, WITH AN EXTENDED LIFE, FOR USE IN A SCANNING ELECTRON-MICROSCOPE JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1972, 5 (11): : 1046 - &
- [4] SCANNING ELECTRON-MICROSCOPE ATTACHMENT FOR ELECTRON-MICROSCOPE JOURNAL OF ELECTRON MICROSCOPY, 1972, 21 (03): : 256 - 256
- [5] APPLICATIONS OF A SEMICONDUCTOR BACKSCATTERED ELECTRON DETECTOR IN A SCANNING ELECTRON-MICROSCOPE JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1975, 8 (07): : 607 - 610
- [6] SILICON DETECTOR FOR STEREOSCAN SCANNING ELECTRON-MICROSCOPE JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (09): : 916 - 920
- [7] AN IMAGING SECONDARY-ELECTRON DETECTOR FOR THE SCANNING ELECTRON-MICROSCOPE SCANNING ELECTRON MICROSCOPY, 1983, : 467 - 478
- [8] SECONDARY-ELECTRON DETECTOR FOR SHIELDED SCANNING ELECTRON-MICROSCOPE JOURNAL OF ELECTRON MICROSCOPY, 1973, 22 (03): : 286 - 286
- [9] OPERATION OF A CHANNELTRON IMAGE INTENSIFIER IN ELECTRON-MICROSCOPE JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (03): : 273 - 275
- [10] USE OF SCANNING ELECTRON-MICROSCOPE IN MICROTOMOGRAPHY PISMA V ZHURNAL TEKHNICHESKOI FIZIKI, 1991, 17 (23): : 10 - 13