DEVICE FOR MARKING SPECIMENS DURING HIGH-TEMPERATURE VACUUM TESTING

被引：0

作者：

LEVIN, AE

机构：

来源：

INDUSTRIAL LABORATORY | 1969年 / 35卷 / 03期

关键词：

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：462 / &

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