NEAR-FIELD PROBES FOR EMC TESTING

被引：0
|
作者：
CATTO, CJD
机构：
来源：
ELECTRONICS WORLD & WIRELESS WORLD | 1993年 / 1686期
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：413 / 413
页数：1
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