PENETRATION DEPTH IN YBA2CU3O7 THIN-FILMS FROM FAR-INFRARED TRANSMISSION

被引:12
|
作者
DEVAULCHIER, LA [1 ]
VIEREN, JP [1 ]
ELAZRAK, A [1 ]
GULDNER, Y [1 ]
BONTEMPS, N [1 ]
机构
[1] UNIV RENNES 1,CHIM SOLIDE & INORGAN MOLEC LAB,CNRS,URA 1495,F-35042 RENNES,FRANCE
来源
PHYSICAL REVIEW B | 1995年 / 52卷 / 01期
关键词
D O I
10.1103/PhysRevB.52.564
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We compare the analytical expressions for the transmission and the surface resistance of a thin superconducting film and we point out the differences and similarities between the two quantities. We show that in the case of the transmission, this single quantity allows a straightforward determination of the electromagnetic penetration depth (TTc) at low temperatures. We illustrate this point by transmission measurements at different fixed far-infrared frequencies (460 cm-1) in two purposely very different YBa2Cu3O7 thin films. We find 2900 and 2000, respectivley, for the absolute value of their electromagnetic penetration depth at TTc, which suggests an extrinsic origin of the field penetration in these samples. Such an assignment may further clarify the temperature dependence of the penetration depth which has been observed in thin films. © 1995 The American Physical Society.
引用
收藏
页码:564 / 569
页数:6
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