BETA-TUNGSTEN UNDERLAYER FOR LOW-NOISE THIN-FILM LONGITUDINAL MEDIA

被引:4
|
作者
RANJAN, R
机构
[1] Seagate Technology, Advanced Media Engineering, Minneapolis, MN 55435
关键词
D O I
10.1063/1.344805
中图分类号
O59 [应用物理学];
学科分类号
摘要
This work investigates the magnetic and media noise properties of Co-15 at. % Cr media having β-W underlayer. These results are correlated with the crystallography and the grain structure of the media. Results show that H c increases with β-W underlayer thickness up to around 100 nm and becomes constant beyond that. The β-W underlayer seems to influence the epitaxial growth of Co (112̄0) and thus has c axis in the plane. Media noise increases with β-W underlayer film thickness. CoCr/β-W media exhibits almost two times lower media noise than a CoCr/Cr media having identical Hc and Brt. The low noise behavior in CoCr/β-W is due to the unique grain structure which reduces the exchange interaction between the CoCr grains.
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页码:4698 / 4700
页数:3
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