X-RAY MICROSCOPY AND SPECTROMICROSCOPY

被引:6
|
作者
MARGARITONDO, G
机构
关键词
D O I
10.12693/APhysPolA.82.283
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Progress in the instrumentation and, in particular, in the photon sources makes it possible to implement a number of established X-ray spectroscopies in a high-lateral-resolution mode. We discuss the general trends of this field, and then we present a detailed analysis of a particular and very interesting branch: photoemission spectromicroscopy. The results include a recent world record in lateral and energy resolution, obtained by the MAXIMUM system at Wisconsin, and microimages of materials science systems as well as of neuron networks.
引用
收藏
页码:283 / 294
页数:12
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