INFLUENCE OF SUBSTRATE PROPERTIES ON MICROWAVE LOSSES IN THIN-FILMS OF SEMICONDUCTORS

被引：0
|
作者：
COVINGTON, DW [1 ]
RAY, DC [1 ]
机构：
[1] GEORGIA INST TECHNOL, SCH ELECT ENGN, ATLANTA, GA 30332 USA
来源：
SOLID-STATE ELECTRONICS | 1973年 / 16卷 / 03期
关键词：
D O I：
10.1016/0038-1101(73)90002-6
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：301 / 308
页数：8
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