NORMAL-STATE RESISTANCE FLUCTUATIONS IN HIGH-T-C CUPRATE FILMS

被引：28
|
作者：
LIU, L [1 ]
ZHANG, K [1 ]
JAEGER, HM [1 ]
BUCHHOLZ, DB [1 ]
CHANG, RPH [1 ]
机构：
[1] NORTHWESTERN UNIV,DEPT MAT SCI & ENGN,EVANSTON,IL 60208
来源：
PHYSICAL REVIEW B | 1994年 / 49卷 / 05期
关键词：
D O I：
10.1103/PhysRevB.49.3679
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We have measured l/f resistance fluctuations at room temperature in YBa2Cu3Ox films as a function of oxygen content, x. The films were single phase, c-axis oriented and grown by pulsed organometallic-beam epitaxy on LaAlO3 substrates. In contrast to the monotonic increase of the film resistance with decreasing x, the normalized noise power was found to exhibit a sharp minimum at x = 6.5. We attribute this behavior to vacancy creation in the Cu-O chains and discuss a simple model based on parallel conduction paths through both chains and planes.
引用
收藏
页码：3679 / 3682
页数：4
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